| 论文编号: | |||||||||
| 作者: | Qi, GC | ||||||||
| 刊物名称: | JOURNAL OF APPLIED PHYSICS | ||||||||
| 所属学科: | Materials Science, Multidisciplinary; Physics, Condensed Matter | ||||||||
| 论文题目英文: | Characteristic capacitance in an electric force microscope determined by using sample surface bias effect | ||||||||
| 年: | 2008 | ||||||||
| 卷: | 103 | ||||||||
| 期: | 11 | ||||||||
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| 联系作者: | Wang, C | ||||||||
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| 参与作者: | Qi, GC; Yan, H; Guan, L; Yang, YL; Qiu, XH; Wang, C; Li, YB; Jiang, YP | ||||||||
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