论文

Characteristic Tip–Substrate Capacitance Studied Using Force Spectroscopy Method of Atomic Force Microscopy

论文编号:

作者:

Reynier I. Revilla

刊物名称:

Mesoscale and Nanoscale Physics

所属学科:

论文题目英文:

Characteristic Tip–Substrate Capacitance Studied Using Force Spectroscopy Method of Atomic Force Microscopy

年:

2016

卷:

期:

页:

联系作者:

Yan–Lian Yang, Chen Wang

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