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论文

Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno [2,3-b] benzothiophene-Based Thin-Film Transistor

论文编号:
作者: Jiawei Wang
刊物名称: IEEE TRANSACTIONS ON ELECTRON DEVICES
所属学科:
论文题目英文: Temperature-Dependent Gate Bias Stress Effect in Dioctylbenzothieno [2,3-b] benzothiophene-Based Thin-Film Transistor
年: 2017
卷: 64
期:
页: 1723-1727
联系作者: Chao Jiang
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